# [DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images

_Computers, Materials & Continua · Ug˘ur Çig˘dem, Kenan Zengin · 2026_

Canonical: https://diginpl.com/books/paper-cmc-2026-089124
Last updated: 2026-11-10

## Quick facts

- **Author:** Uğur Çiğdem; Kenan Zengin ([Crossref](https://doi.org/10.32604/cmc.2026.089124))
- **Published:** 2026 ([Crossref](https://doi.org/10.32604/cmc.2026.089124))
- **Publisher:** Tech Science Press ([Crossref](https://doi.org/10.32604/cmc.2026.089124))
- **Journal:** Computers, Materials & Continua ([Crossref](https://doi.org/10.32604/cmc.2026.089124))
- **DOI:** 10.32604/cmc.2026.089124 ([Crossref](https://doi.org/10.32604/cmc.2026.089124))

## Questions

**Who wrote [DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images?**  
[DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images was written by Uğur Çiğdem, Kenan Zengin.

**When was [DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images first published?**  
[DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images was first published in 2026.

## Sources

- [Publisher record (DOI, via Crossref)](https://doi.org/10.32604/cmc.2026.089124)

## Licence and attribution

Open-access publication. Read it free at the publisher: https://doi.org/10.32604/cmc.2026.089124.

## Cite this page

"[DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images". DigiNepal. Last updated 10 November 2026. https://diginpl.com/books/paper-cmc-2026-089124. Retrieved 11 November 2026.