{"id":"paper-cmc-2026-089124","type":"book","url":"https://diginpl.com/books/paper-cmc-2026-089124","language":"en","name":"[DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images","name_en":"[DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images","name_ne":null,"description":"Computers, Materials & Continua · Ug˘ur Çig˘dem, Kenan Zengin · 2026","headline":"Computers, Materials & Continua · Ug˘ur Çig˘dem, Kenan Zengin · 2026","also_known_as":[],"summary":"","summary_more":[],"facts":[{"key":"authors","label":"Author","values":[{"text":"Uğur Çiğdem"},{"text":"Kenan Zengin"}],"source":{"label":"Crossref","url":"https://doi.org/10.32604/cmc.2026.089124"}},{"key":"published","label":"Published","values":[{"text":"2026","date":"2026"}],"source":{"label":"Crossref","url":"https://doi.org/10.32604/cmc.2026.089124"}},{"key":"publisher","label":"Publisher","values":[{"text":"Tech Science Press"}],"source":{"label":"Crossref","url":"https://doi.org/10.32604/cmc.2026.089124"}},{"key":"journal","label":"Journal","values":[{"text":"Computers, Materials & Continua"}],"source":{"label":"Crossref","url":"https://doi.org/10.32604/cmc.2026.089124"}},{"key":"doi","label":"DOI","values":[{"text":"10.32604/cmc.2026.089124","url":"https://doi.org/10.32604/cmc.2026.089124"}],"source":{"label":"Crossref","url":"https://doi.org/10.32604/cmc.2026.089124"}}],"office":null,"sections":[],"cited":[],"cited_from":null,"videos":[],"last_reviewed":null,"organizations":[],"same_as":["https://doi.org/10.32604/cmc.2026.089124"],"faq":[{"q":"Who wrote [DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images?","a":"[DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images was written by Uğur Çiğdem, Kenan Zengin."},{"q":"When was [DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images first published?","a":"[DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images was first published in 2026."}],"related":[],"places_in":[],"nearby":[],"image":null,"sources":[{"label":"Publisher record (DOI, via Crossref)","url":"https://doi.org/10.32604/cmc.2026.089124","license":null}],"license":null,"attribution":"Open-access publication. Read it free at the publisher: https://doi.org/10.32604/cmc.2026.089124.","cite":"\"[DDSWF] Deep Defect-Specific Weighted Features: An Advanced Framework for High-Precision Identification of Critical Defects in ELPV Images\". DigiNepal. Last updated 10 November 2026. https://diginpl.com/books/paper-cmc-2026-089124. Retrieved 11 November 2026.","date_modified":"2026-11-10T06:52:07Z","facts_checked":"2026-11-10","alternates":{"html":"https://diginpl.com/books/paper-cmc-2026-089124","en":"https://diginpl.com/books/paper-cmc-2026-089124","ne":null}}